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When precision and reliability matter, trust AlphaTest Corporation to deliver unmatched solutions. Our microHELIX test probes and test fixtures set the benchmark for excellence in semiconductor testing. Experience enhanced accuracy, durability and efficiency like never before.
| Probe Groups Data Sheets |
Scaled Image | Diameter | Minimum Centers | Body Length + | Plunger Length + | Pin2 Length + | = Length Overall | ||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| µm | inch | µm | inch | µm | inch | µm | inch | µm | inch | µm | inch | ||
| S500 Groups |  |
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| S500*2440-P1 |  |
508 | (.020) | 592 | (.023) | 2440 | (.096) | 610 | (.024) | 3050 | (.120) | ||
| S500*3800-P1 |  |
508 | (.020) | 592 | (.023) | 3800 | (.150) | 1300 | (.051) | 5100 | (.201) | ||
| S500*4500-P2 |  |
508 | (.020) | 592 | (.023) | 4500 | (.177) | 1300 | (.051) | 1300 | (.051) | 7100 | (.280) |
| S500*6350-P1 |  |
508 | (.020) | 592 | (.023) | 6350 | (.250) | 1900 | (.075) | 8250 | (.325) | ||
| S500*6350-P2 |  |
508 | (.020) | 592 | (.023) | 6350 | (.250) | 1900 | (.075) | 1900 | (.075) | 10150 | (.400) |
| S500*6600-P1 |  |
508 | (.020) | 592 | (.023) | 6600 | (.260) | 3800 | (.150) | 10400 | (.409) | ||
| S400 Groups | |
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| S400*3800-P1 |  |
406 | (.016) | 477 | (.0188) | 3800 | (.150) | 1300 | (.250) | 5100 | (.201) | ||
| S400*4500-P2 |  |
406 | (.016) | 477 | (.0188) | 4500 | (.177) | 1300 | (.051) | 1300 | (.051) | 7100 | (.280) |
| S400*6350-P1 |  |
406 | (.016) | 477 | (.0188) | 6350 | (.250) | 1900 | (.075) | 8250 | (.325) | ||
| S400*6350-P2 |  |
406 | (.016) | 477 | (.0188) | 6350 | (.250) | 1900 | (.075) | 1900 | (.075) | 10150 | (.400) |
| S300 Groups |  |
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| S300*2300-P1 |  |
304 | (.012) | 363 | (.0143) | 2300 | (.091) | 1000 | (.150) | 3300 | (.130) | ||
| S300*3800-P1 |  |
304 | (.012) | 363 | (.0143) | 3800 | (.150) | 1300 | (.051) | 5100 | (.201) | ||
| S300*3800-P2 |  |
304 | (.012) | 363 | (.0143) | 3800 | (.150) | 1300 | (.051) | 1300 | (.051) | 6400 | (.252) |
| S200 Groups |  |
||||||||||||
| S200*2300-P1 |  |
203 | (.008) | 254 | (.010) | 2300 | (.091) | 1000 | (.039) | 3300 | (.130) | ||
| S200*2300-P2 |  |
203 | (.008) | 254 | (.010) | 2300 | (.091) | 1000 | (.039) | 1000 | (.039) | 4300 | (.169) |
| S200*3800-P1 |  |
203 | (.008) | 254 | (.010) | 3800 | (.150) | 1300 | (.051) | 5100 | (.201) | ||
Made in Washington state, the unique construction of our microHELIX probes enables tighter pitch, closer centers and reduced crosstalk (below that achieved with traditional spring loaded test probes), thereby ensuring precise electrical contact every time. With unparalleled placement precision, say goodbye to inconsistent readings and unreliable tests.
These solderless probes are built to withstand the rigorous demands of semiconductor testing. While ensuring reliable contact in sockets, fixtures, and contactors, our fine pitch pogo pin probes can reach into the tightest center-to-center spacings - down to a tenth of an inch or a quarter of a millimeter (.010" or .254mm). Our microprobes are specifically engineered to meet the industry's stringent requirements. With robust materials and meticulous craftsmanship, our test probes provide long-lasting performance and reduce the need for frequent replacements.
Our micro sized test probes are designed to be used with a probe guide, eliminating the need for solder and simplifying the testing process. This convenient and efficient solution saves time and effort and allows seamless integration into your testing setup. Boost productivity and streamline your operations with our advanced testing solutions.
We understand the diverse requirements of our clients, which is why we offer a range of diameters in these spring loaded probes, the S200, S300, S400, and S500 series. The variety allows for seamless integration into sockets, fixtures, and contactors, catering to your specific testing setup - even those with challenging topographies - so you can achieve faster and more efficient in-circuit testing (ICT) and functional circuit testing (FCT)
While we showcase just a few configurations above, our expert team understands that every application has unique requirements. If you don't find the size or configuration that fits your needs, simply reach out to us. We are eager to collaborate with you and customize the perfect solution for your needs.
Contact us to learn more about our products and discover how our precision testing solutions can elevate your performance in fine-pitch applications.
We take pride in offering high-quality products designed to meet the unique needs of our customers. Our comprehensive range of high-quality products will enhance precision and accuracy in your test configuration and are the ideal solution for fine-pitch applications and advanced packaging such as CSP, BGA, SiP, SoC, flex-circuits, and micro PCBs, ICT and FCT. We can also help design fixtures or sockets for your specific testing needs.
Get in touch with us for questions about our fine pitch test probes and fixtures. You can also check out our FAQs for more information.
| AlphaTest Corporation | 261 W. Business Park Loop | Shelton, WA 98584 | 360-462-0201 | info@alphatest.com |  |
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